国家理论科学研究中心学术演讲 NCTS Industrial Statistics Research Group Seminar Date: 11:00am~4:00pm, Sept. 25 (Fri.), 2009 (1) 11:00am-1:00pm, Group Meeting ---------------------------------------------------------------------------- (2) 1:00pm-2:30pm Speaker: Prof. Shuen-Lin Jeng 郑顺林 (NCKU) Topic: Reliability Models on Nanotechnology Abstract: In wear, aging, and fatigue growth processes, continuous degradation models (CDMs) have been applied to assess device reliability for decades. On the other hand, in practical applications, discrete degradation processes (DDPs) have been also observed for years and are discussed again lately for leakage current of thin gate oxides in nano-technology. Here a DDP means that the occurrence of degradation event follows a certain discrete mechanism in a specified time interval and each discrete degradation event leads to an increment of damage. Besides the two separate kinds of degradation types, mixed degradation processes (MDPs), which integrate both continuous and discrete degradation patterns, are observed recently in the measurements of electric properties of IC products. The first part of this talk will be the model building for MDPs. The second part will be a brief review of some reliability research on nanotechnology for open discussion. ---------------------------------------------------------------------------- (3) 2:30pm-4:00pm Speaker: Prof. Jyh-Jen Horng 洪志真 (NCTU) Topic: Profile Monitoring简介 Abstract: 制程监控在品管上是很重要的一环。近年来统计品质管制 (SPC) 上的研究愈来愈多，范畴也愈来愈广。由单变量的问题推广至多变量的问题；由独立性资料推广至自我相关 (auto-correlated) 资料等。近年来有一个新的研究主题相当热门: SPC for Profile Monitoring。一般而言，品质特性 (quality characteristic) 资料，无论是单变量或多变量，都是一个变数。然而对某些制程而言，一个产品之品质特性是由反应变数和一或多个解释变数间之关系(relationship)来界定，而不再是一般之变数。因此一个产品之品质特性乃以一条曲线或是一个曲面或其离散化(discretized) 後之资料型式来呈现，称之为profile (纵断面或剖面)。例如Kang and Albin (2000)文中有一个例子为苯丙氨酸甲脂 (aspartame, 一种低热量人工甜味剂)在每公升的水中所溶解的量与水温度之关系，每个样本即为一条曲线。此种形式之资料又称为曲线资料 (curve data)，处理这种资料的统计模型很多，可分为参数回归和半参数/无参数回归，其中函数资料分析 (functional data analysis)，在半参数/无参数回归的研究领域内是目前相当受到重视且还有许多研究空间的研究课题。本人不揣浅陋介绍大家一些我所知道的Profile Monitoring上的研究，希望藉此抛砖引玉，引起大家共同合作研究的兴趣。 Place: Lecture Room A of National Center for Theoretical Sciences, 4th Floor, The 3rd General Building, National Tsing Hua University --

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